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Vasilescu A et al (1997) The NIEL scaling hypothesis applied to neutron spectra of irradiation facilities in the ATLAS and CMS SCT, ROSE/TN/97-2, CERN (1997) Google Scholar Vasilescu A, Lindstroem G (2000) Displacement damage in silicon, on-line compilation. http://rd50.web.cern.ch/RD50/NIEL/default.htmlDownload referencesAuthor informationAuthors and AffiliationsDepartment of Subatomic Physics, Institut Pluridisciplinaire Hubert Curien (IPHC), Strasbourg Cedex 2, FranceMarc WinterHelmholtzzentrum für Schwerionenforschung GmbH (GSI), Darmstadt, GermanyMichael DeveauxAuthorsMarc WinterYou can also search for this author in PubMed Google ScholarMichael DeveauxYou can also search for this author in PubMed Google ScholarCorresponding authorCorrespondence to Marc Winter .Editor informationEditors and AffiliationsCenter for Particle Physics, University of Siegen, Siegen, GermanyIvor Fleck IRFU, CEA Saclay, Gif-sur-Yvette, FranceMaxim Titov Department of Physics, University of Siegen, Siegen, GermanyClaus Grupen Unité Imagerie Moléculaire In Vivo, Orsay, FranceIrène Buvat Rights and permissionsCopyright information© 2021 Springer Nature Switzerland AGAbout this entryCite this entryWinter, M., Deveaux, M. (2021). Complementary Metal-Oxide-Semiconductor (CMOS) Pixel Sensors. In: Fleck, I., Titov, M., Grupen, C., Buvat, I. (eds) Handbook of Particle Detection and Imaging. Springer, Cham. https://doi.org/10.1007/978-3-319-93785-4_55Download citation.RIS.ENW.BIBDOI: https://doi.org/10.1007/978-3-319-93785-4_55Published: 13 December 2021 Publisher Name: Springer, Cham Print ISBN: 978-3-319-93784-7 Online ISBN: 978-3-319-93785-4eBook Packages: Physics and AstronomyReference Module Physical and Materials ScienceReference Module Chemistry, Materials and PhysicsPublish with us
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